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| 2SA1972 TOSHIBA Transistor Silicon PNP Triple Diffused Type 2SA1972 High-Voltage Switching Applications Unit: mm * High breakdown voltage: VCEO = -400 V Absolute Maximum Ratings (Ta = 25C) Characteristics Collector-base voltage Collector-emitter voltage Emitter-base voltage Collector current Base current Collector power dissipation Junction temperature Storage temperature range DC Pulse Symbol VCBO VCEO VEBO IC ICP IB PC Tj Tstg Rating -400 -400 -7 -0.5 -1 -0.25 900 150 -55 to 150 Unit V V V A A mW C C JEDEC Note: Using continuously under heavy loads (e.g. the application of high JEITA temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the TOSHIBA 2-5J1A reliability significantly even if the operating conditions (i.e. Weight: 0.36 g (typ.) operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). 1 2006-11-09 2SA1972 Electrical Characteristics (Ta = 25C) Characteristics Collector cut-off current Emitter cut-off current Collector-emitter breakdown voltage DC current gain Collector-emitter saturation voltage Base-emitter saturation voltage Transition frequency Collector output capacitance Turn-on time Symbol ICBO IEBO V (BR) CEO hFE (1) hFE (2) VCE (sat) VBE (sat) fT Cob ton 20 s Switching time Part No. IB2 Test Condition VCB = -400 V, IE = 0 VEB = -7 V, IC = 0 IC = -10 mA, IB = 0 VCE = -5 V, IC = -20 mA VCE = -5 V, IC = -100 mA IC = -100 mA, IB = -10 mA IC = -100 mA, IB = -10 mA VCE = -5 V, IC = -50 mA VCB = -10 V, IE = 0, f = 1 MHz Output 2 k Min -400 140 140 Typ. -0.4 -0.76 35 18 0.2 Max -10 -1 450 400 -1.0 -0.9 V V MHz pF Unit A A V IB1 IB2 IB1 Storage time tstg 2.3 s VCC = -200 V Fall time tf IB1 = -10 mA, IB2 = 20 mA, duty cycle 1% 0.2 Marking A1972 Part No. (or abbreviation code) Lot No. A line indicates lead (Pb)-free package or lead (Pb)-free finish. 2 2006-11-09 2SA1972 IC - VCE -500 -100 -400 -80 -60 -40 -20 -10 -5 -2 -400 -500 Common emitter VCE = -5 V IC - VBE (mA) Collector current IC Collector current IC (mA) -300 -1 -300 -200 Ta = 100C 25 -55 IB = -0.5 mA -100 Common emitter Ta = 25C 0 0 -2 -4 -6 -8 -10 -12 -14 -16 -18 -20 -100 0 0 -0.2 -0.4 -0.6 -0.8 -1 -1.2 Collector voltage VCE (V) Collector-emitter voltage VBE (V) hFE - IC 1000 100 25 100 50 30 Ta = -55C -30 Common emitter VCE (sat) - IC Collector-emitter saturation voltage VCE (sat) (V) 500 300 -10 -5 -3 IC/IB = 10 DC current gain hFE -1 -0.5 -0.3 100 -0.1 -0.05 Ta = -55C 25 10 Common emitter 5 3 -1 VCE = -5 V -10 -100 -1000 -0.03 -1 -10 -100 -1000 Collector current IC (mA) Collector current IC (mA) Safe Operating Area -3000 100 s* -1000 IC max (pulsed)* IC max (continuous) 300 s* 10 s* 100 ms* 10 ms* DC operation Ta = 25C -30 1 ms* (mA) Collector current IC VBE (sat) - IC -10 -300 Base-emitter saturation voltage VBE (sat) (V) Common emitter -5 -3 IC/IB = 10 -100 -1 -0.5 -0.3 -55 -10 *: Single nonrepetitive pulse Ta = 25C Curves must be derated linearly with increase in temperature. -3 -10 -30 Ta = 100C 25 -3 VCEO max -100 -300 -1000 -0.1 -1 -10 -100 -500 -1 -1 Collector current IC (mA) Collector-emitter voltage VCE (V) 3 2006-11-09 2SA1972 RESTRICTIONS ON PRODUCT USE * The information contained herein is subject to change without notice. 20070701-EN * TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 4 2006-11-09 |
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